DXF 500

Discovery 氙灯闪光导热仪 DXF 500 平台采用获得专有的 High-Speed Xenon-pulse Delivery™ (HSXD) 源和多面变形 Light Pipe™。这些光学元件共同向样品发射能量巨大且强度均匀的光脉冲，同时又能防止对样品支架过度照射。只有 TA 仪器的高能氙灯设计能够在室温至 500°C 的温度范围内测量直径删除/广泛为 25.4 mm 的样品。采用大尺寸样品不仅能够减少因材料不均匀而导致的误差，还能对分布不均匀的复合材料进行代表性测量。DXF 平台专为研发项目以及生产控制而设计

DXF 500 特性

• 获得专有的高速氙灯脉冲发射系统提供的能量比同类产品设计高出 50%，可对各种各样的样品进行 准确的测量，而不受样品厚度和导热系数影响
• 获得专有的 Light Pipe™ 可以高效聚集和准直光束，并对样品进行均匀照射
• 实时脉冲映射用于测量薄型和高导热率材料的热扩散系数
• 拥有各种型号的样品托盘，可盛放不同尺寸（删除/广泛直径达 25.4 mm）和形状的样品，还有多种适用于不同材料（液体、粉末、层压材料、薄膜等）的专用固定装置，可删除/广泛限度实现样品测试灵活性
• 自动进样器采用获得专有的四位氧化铝样品托盘设计，可删除/广泛限度提升生产率
• 先进的电阻加热炉设计可在室温至 500˚C 下为样品提供出色的温度稳定性和一致性，并支持在空气、惰性气体或真空环境中进行测量
• 高灵敏度红外检测器具备优异信噪比，可在整个温度范围内提供 高精度
• 专为满足各类行业标准测试方法而设计，包括 ASTM E1461、ASTM C714、ASTM E2585、ISO 13826、ISO 22007-第 4 部分、ISO 18755、BS ENV 1159-2、DIN 30905 和 DIN EM821

激光源

类型	台式
脉冲能（可变）	高达 25 焦耳
脉宽	400 微秒至 600 微秒
专有传输光纤	Light Pipe 光束导管

加热炉

温度范围	室温至 500°C
气体环境	空气、惰性气体、删除/广泛真空压强（50 毫托）

检测

热扩散系数范围	0.01 to 1000 mm2/s
导热系数范围	0.1 to 2000 W/(m*K)
数据采集	16 bit

精度

热扩散系数	±2.3%
导热系数	±4%

可重复性

热扩散系数	±2.0%
导热系数	±3.5%

样品

圆形	直径 8、10、12.7 和 25.4 mm
方形	边长 8 和 10 mm
删除/广泛厚度	10 mm

自动进样器

类型	四位托盘，惰性气体， 删除/广泛真空压强 50 毫托

The Proven Software Platform for Easy, Accurate Flash Analysis Data

All Discovery Light Flash instruments include FlashLine™ software for Instrument Control and Data Analysis. The Microsoft Windows based software features an intuitive tablebased format for simple programming of experimental parameters in the instrument control interface. Real-time monitoring allows for immediate assessment of the data quality and instrument performance during each test. The Data Analysis module’s automated routines provide users with advanced analysis tools, including models for heat loss correction in both conduction and radiation.

Integrated with the pulse-shape mapping measuring system, FlashLine determines the exact shape of the laser pulse versus time to make pulse shape and width correction. It also identifies the flash zero origin and enables finite pulse effect correction which is critical to guarantee accurate measurements for thin samples and high-diffusivity materials. Additionally, the TA Instrument developed “Goodness of Fit” evaluation tool allows the user to select the best results calculated by different Thermal Diffusivity models.

Software Features:

• Unlimited temperature segments with user-defined heat ramp steps
• User-selectable laser energy for each sample by temperature segment
• Data analysis of any already-completed segment during testing
• Determination of the specific heat by comparative method
• Option for automatic multiple-shots selection and averaging
• Correction for radiation component of transparent and translucent samples
• Automatic optimization of flash energy level
• Option for sample skip, and precision criterion
• Fast zoom function for X and Y segments
• Thermal diffusivity, specific heat, and thermal conductivity tables and graphs as a function of temperature
• Calculations of all models during testing and available by the completion of testing

Standard models include:

• Gembarovic for multi-dimensional heat loss correction and non-linear regression
• Goodness of Fit for the best model result selection
• Pulse gravity center to determine t₀
• Pulse length and shape correction
• Two and three layers analysis
• In-plane
• Main models: Clark and Taylor, Cowan, Degiovanni, Koski, Least Squares, Logarithmic, Moment, Heckman, Azumi, and Parker